Charge collection efficiency simulations of irradiated silicon strip detectors
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چکیده
منابع مشابه
Charge Collection and Capacitance-Voltage analysis in irradiated n-type magnetic Czochralski silicon detectors
The depletion depth of irradiated n-type silicon microstrip detectors can be inferred from both the reciprocal capacitance and from the amount of collected charge. Capacitance-voltage (C-V) measurements at different frequencies and temperatures are being compared with the bias voltage dependence of the charge collection on an irradiated n-type magnetic Czochralski silicon detector. Good agreeme...
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High-resistivity p-type silicon has emerged as one of the most promising materials for the finely segmented detectors to be used in particle physics experiments where high levels of radiation damage are expected. Beside the standard high-purity float-zone (FZ) silicon, relatively high-resistivity magnetic Czocharlski (MCz) is now available from industry. This material has been proposed as possi...
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.................................................................................... i Acknowledgements....................................................................... ii List of Figures............................................................................. iv
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During the next few months more than 400 Silicon Strip Detector (SSD) modules will be tested before and after their installation on the ladders and dispatch to Brookhaven National Laboratory. The requirements for the test bench have been defined and the architectural design of all software components has been completed. The system is distributed and features a client–server architecture. Measur...
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The electric eld distribution inside heavily irradiated silicon particle detectors is deduced using observations of particle and MIP signals. In these detectors particle signals are observed for both p and n side illumination even when the detector is only partially depleted . The observations indicate that the electric eld distribution within the detector has the contribution expected from a u...
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ژورنال
عنوان ژورنال: Journal of Instrumentation
سال: 2014
ISSN: 1748-0221
DOI: 10.1088/1748-0221/9/12/c12010